Noise and bandwidth
Johnson, generation-recombination, 1/f, bandwidth, and instrumentation contributions.
Technical scopeInfrared photodetector analysis
Independent analysis of infrared detector measurements.
Electrical, spectral, and noise data are evaluated together for HgCdTe (MCT), InSb, and related infrared detectors.
- 3 to 5 pages
- Concise technical report
- 5 to 7 days
- Standard turnaround
- Independent
- Conclusions tied to measured data
Physics-based interpretationIndependent technical reviewMeasurements chosen to resolve uncertainty
Core capabilities
Measurements are considered together
A detector can appear limited by the material, the device geometry, the operating point, or the test system. The full dataset is used to distinguish among them.
Bias dependence
Operating regimes, gain behavior, saturation, heating, contacts, and current spreading.
Technical scopeSpectral response
Cutoff, composition, thickness, response shape, and measurement artifacts.
Technical scopeReview method
Start with the data already available.
The review checks the measurements, the test conditions, and the physical explanations before recommending additional work.
See the complete review process- Review the test conditions
Device geometry, temperature, bias, bandwidth, calibration, and instrumentation are established first.
- Compare competing explanations
Each proposed mechanism is checked against the observed scaling and known physical limits.
- Specify the resolving measurement
The next test is selected for its ability to distinguish the remaining explanations.
Technical review