Service Overview

Experience-based interpretation of your existing device characterization data. We identify what limits performance and what doesn't.

Deliverables: Technical document (3–5 pages) with annotated figures, root-cause analysis, and suggested next actions. Standard turnaround: 5–7 business days.

Best For

Teams needing correct attribution of noise sources, bias regimes, or performance bottlenecks; organizations evaluating technology paths or vendor claims.

Technical Focus

• Noise: Identify Johnson, GR, and 1/f regions; corner extraction; measurement artifact rejection.
• IV & Bias Analysis: Optimal bias identification; regime classification; saturation and transport-limited behavior.
• Spectral Interpretation: Cutoff wavelength, thickness, and composition; spectral quality assessment.
• Performance Modeling: Responsivity and D* calculation; expected-vs-measured performance.
• Process Insight: Material growth insights; fabrication and processing performance variability.

Client-Provided Data

• IV curves (single or multi-temperature), operating points
• Noise PSD with bandwidth/setup notes
• Responsivity, gain, or signal data
• Transmission, absorption, or quantum efficiency (QE) spectra
• Device structure, test notes, existing hypotheses

Methodology

1. Determine which physical mechanisms can and cannot explain the observed electrical, spectral, and noise behavior.
2. Reject mechanisms violating physics constraints or known scaling behaviors.
3. Develop a minimal but technical explanation and propose validation experiments.

Modern analytical tools including AI-assisted workflows. All conclusions remain physics-constrained and independently verifiable.